Scanning Electron Microscopy

Scanning electron microscopy is a technique for imaging with up to 800,000X magnification. This is achieved by focusing a beam of electrons into a tiny spot and scanning the beam across a sample. The electron beam ejects secondary electrons from the surface of the sample which is collected and recorded to produce an image of the sample. Scanning electron microscopy is typically used to image inorganic material, but it can also be used to image biological matter with special processing.

FEI XL-30

DescriptionSpecification
SEM Resolution< 10 [nm]
Magnification100X to 800,000X
XY Stage Range75 mm
XY Stage Tilt-5° to 45°
Sample Max Dimensions100 mm x 100 mm wide
10 mm tall
Equipment_SEM_A
Equipment_SEM_C
Equipment_SEM_B
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Examples

SEM_Carousel_Frixion
Frixion pen is an erasable ink pen packed with science. This image reveals the microcapsules that contains the thermosensitive ink that becomes invisible when heated.
SEM_Carousel_Rotor
The worlds smallest solar powered car is driven by a microscopic electric motor. This image helps us reverse engineer the motor potentially design a smaller one.
SEM_Carousel_ThinSilicon
The resolution of a scanning electron microscopy is approximately 5 [nm]. This sample was thinned using a focused ion beam in order to image it in a transmission electron microscope which can resolve atoms.
SEM_Carousel_Gun
An electron mirror sample was used to reflect the electron beam to image the objective lens instead of the sample. This technique is used to inspect the electron lens.
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Core Technology

Core TechnologyDescription
SOP: FEI XL-30This document is the standard operating procedure (SOP) for the FEI XL-30 scanning electron microscope at UHNF. This SOP serves as a foundation for initial training and ensures that the equipment can be operated correctly, by everyone, the first time.
Clostridium DifficileThis is a video guide to preparing clostridium difficile bacteria for scanning electron microscopy.
SSP: FEI XL-30This document is the standard service procedure (SSP) for the FEI XL-30 scanning electron microscope at UHNF. This SSP ensures that any staff can effectively perform routine service or repairs correctly, the first time. This document is restricted to equipment custodians. Contact us for access.

Guide

GuideDescription
Training GuideDevelop the basic knowledge and skills towards becoming a good electron microscopist.
PrimerLearn the basics of electron microscopy from Bob Hafner at University of Minnesota.
Biological Sample PreparationLearn various procedures for preparing biological samples for scanning electron microscopy.
ChargingLearn the basics of charging and techniques to manage it
Focusing and StigmatismLearn the basics of focusing and stigmatism and techniques to obtain sharp images
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