Atomic Force Microscopy

Atomic force microscopy is a technique for characterizing the physical properties of materials through physical interactions with a microscopic probe. This technique provide researchers a variety of options to stimulate their samples and measure a variety of responses. This has lead to countless numbers of techniques that helps us experimentally expand our understanding of the microscopic world. View this poster for a sample of some common techniques.

Asylum Research MFP-3D-Origin+

DescriptionSpecification
ModesMode Poster
EnvironmentAir or Liquid
Z Scanner Range15 [μm]
Z Scanner Resolution< 250 [pm]
XY Scanner Range110 [μm]
XY Sample Stage Range10 [mm]
Equipment_AFM_A
Equipment_AFM_B
Equipment_AFM_C
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Examples

AFM_Carousel_MagneticTape
Magnetic force microscopy mode show that this magnetic tape contains stripes of alternating magnetic domains. The dark stripes represent the south poles of the magnetic and the light stripes represent the north poles.
AFM_Carousel_DrillInsertWear
Tapping mode microscopy is used to characterize the topography of a worn out drill bit. The pits suggests that grains may be detaching from the drill bit. Perhaps the durability can be improved by using a stronger binding agent.
AFM_Carousel_CheekSwab
Contact mode is used to image an epithelial cheek cell.
AFM_Carousel_AlRing
Tapping mode is used to characterize the surface a tungsten carbide cutting tool insert. A microscopic texture is milled into the insert in an attempt to improve its durability.
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Core Technology

Core TechnologyDescription
SOP: AR MFP-3D Origin+This document is the standard operating procedure (SOP) for the Asylum Research MFP-3D Origin+ atomic force microscope at UHNF. This SOP serves as a foundation for initial training and ensures that the equipment can be operated correctly, by everyone, the first time.
XY DriftThe XY stage drift is characterized for the Asylum Research MFP-3D Origin+ atomic force microscope.
Z DriftThe Z actuator drift is characterized for the Asylum Research MFP-3D Origin+ atomic force microscope.
Variable Field ModuleThe variable field module is characterized for the Asylum Research MFP-3D Origin+ atomic force microscope.
Source Meter IntegrationA Keithley 2400 source meter was integrated into the Asylum Research MFP-3D Origin+ atomic force microscope to provide resistance measurements.
SSP: AR MFP-3D Origin+This document is the standard service procedure (SSP) for the Asylum Research MFP-3D Origin+ atomic force microscope at UHNF. This SSP ensures that any staff can effectively perform routine service or repairs correctly, the first time. This document is restricted to equipment custodians. Contact us for access.

Guide

GuideDescription
Spring Constant CalibrationLearn about cantilever spring constant calibration using the thermal noise tune method and the sader method.
Process DevelopmentAcquire the basic knowledge and skills necessary to become a good atomic force microscopist
Tapping ModeLearn about tapping mode
Contact ModeLearn about contact mode
MFM: Magnetic Force MicroscopyLearn about magnetic force microscopy
PFM: Piezo Force MicroscopyLearn about piezo force microscopy
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