Atomic Force Microscopy
Atomic force microscopy is a technique for characterizing the physical properties of materials through physical interactions with a microscopic probe. This technique provide researchers a variety of options to stimulate their samples and measure a variety of responses. This has lead to countless numbers of techniques that helps us experimentally expand our understanding of the microscopic world. View this poster for a sample of some common techniques.
Asylum Research MFP-3D-Origin+
|SOP: AR MFP-3D Origin+
|This document is the standard operating procedure (SOP) for the Asylum Research MFP-3D Origin+ atomic force microscope at UHNF. This SOP serves as a foundation for initial training and ensures that the equipment can be operated correctly, by everyone, the first time.
|SSP: AR MFP-3D Origin+
|This is a service manual we developed for the Asylum Research MFP-3D Origin+ atomic force microscope at UHNF. This document ensures that any staff can effectively perform routine service or repairs effectively, quickly and at significantly lower cost. This document is restricted to equipment custodians. Contact us for access.