Scanning Electron Microscopy

Scanning electron microscopy is a technique for imaging with up to 800,000X magnification. This is achieved by focusing a beam of electrons into a tiny spot and scanning the beam across a sample. The electron beam ejects secondary electrons from the surface of the sample which is collected and recorded to produce an image of the sample. Scanning electron microscopy is typically used to image inorganic material, but it can also be used to image biological matter with special processing.


SEM Resolution< 5 [nm]
Magnification100X to 800,000X
XY Stage Range75 mm
XY Stage Tilt-5° to 55°
Sample Max Dimensions100 mm x 100 mm wide
10 mm tall


Core Technology

Core TechnologyDescription
SOP: FEI DB235This document is the standard operating procedure (SOP) for the FEI DB235 focused ion beam system at UHNF. This SOP serves as a foundation for initial training and ensures that the equipment can be operated correctly, by everyone, the first time.
SSP: FEI DB235This is a service manual we developed for the FEI DB235 focused ion beam system at UHNF. This document ensures that any staff can effectively perform routine service or repairs effectively, quickly and at significantly lower cost. This document is restricted to equipment custodians. Contact us for access.
Clostridium DifficileThis is a video guide to preparing clostridium difficile bacteria for scanning electron microscopy.


PrimerLearn the basics of electron microscopy from Bob Hafner at University of Minnesota.
Biological Sample PreparationLearn various procedures for preparing biological samples for scanning electron microscopy.